Dynamic Object Tracking at AOI Forum & Show 2017

Published on November 3, 2017 by TIS Marketing.

At this year's AOI Forum & Show (September 28, 2017), The Imaging Source partnered with MiM Tech software and Hi Keen Tech lenses to present the highly versatile imaging solution, IC iVision. The Imaging Source's "33 series" DMK 33GP1300 GigE camera was paired with Hi Keen's low-distortion lens and MiM Tech's image processing library to demonstrate dynamic object tracking and surface defect inspection.

IC iVision display featuring the DMK 33GP1300 GigE camera, Hi Keen's telecentric lens and software by MiM Tech.

As a leading university for electrical and computer engineering studies and research, the campus at The National Chiao Tung University in Hsinchu, Taiwan serves as a perfect venue for the one-day show. Each year, AOIEA hosts the show mainly as an exchange forum for students and researchers involved in automated optical inspection. Integrators, component suppliers, equipment manufacturers, academic researchers and students acquainted themselves with the latest industry developments in hardware and software.